CAES Microscopy and Characterization Suite - INL Partnership Opportunity
Agency: | |
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Level of Government: | Federal |
Category: |
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Opps ID: | NBD00159813266231934 |
Posted Date: | Nov 16, 2023 |
Due Date: | Oct 25, 2023 |
Source: | https://sam.gov/opp/616df2d20b... |
- Contract Opportunity Type: Special Notice (Updated)
- All Dates/Times are: (UTC-07:00) MOUNTAIN STANDARD TIME, DENVER, USA
- Updated Published Date: Nov 16, 2023 12:51 pm MST
- Original Published Date: Apr 12, 2023 12:37 pm MDT
- Updated Response Date: Oct 25, 2023 08:00 am MDT
- Original Response Date: Apr 11, 1999 01:00 pm MDT
- Inactive Policy: 15 days after response date
- Updated Inactive Date: Nov 09, 2023
- Original Inactive Date: May 03, 2023
- Initiative:
- Original Set Aside:
- Product Service Code: B504 - SPECIAL STUDIES/ANALYSIS- CHEMICAL/BIOLOGICAL
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NAICS Code:
- 541380 - Testing Laboratories and Services
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Place of Performance:
Idaho Falls , ID 83402USA
Opportunity: Idaho National Laboratory (INL) and Center for Advanced Energy Studies (CAES) are seeking industry partners to leverage our Advanced Manufacturing Laboratory and Microscopy and Characterization Suite. These laboratories provide cutting-edge equipment such as super inkjet printers and Atomic Force Microscopes for precise and high-resolution detail in material research, fabrication, and characterization.
Microscopy and Characterization Suite (MaCS): The MaCS is a state-of-the-art materials characterization laboratory that provides cross-cutting capabilities that help characterize a wide range of materials, including metals, semiconductors, ceramics, coal and minerals in bulk or powder forms, as well as some organic cellular materials. MaCS contains several high-end pieces of equipment including:
- Two Scanning Transmission Electron Microscopes – Images materials structurally and chemically down to sub-Angstrom scale. Equipped with HAADF, EDS, EELS, EFTEM, Electron Tomography, ASTAR/TopSpin, PicoIndenter, Heating Stage, etc.
- Local Electrode Atom Probe (LEAP) – Creates atom-by-atom maps and images 3-D construction of up to hundreds of millions of atoms.
- Dual Focused Ion Beam – High-resolution, high-vacuum dual-beam SEM/FIB for 2-D and 3-D material characterization and analysis. Equipped with EDS, EBSD and STEM detector.
- Scanning Electron Microscope (SEM) – Images material surfaces ranging from micrometer to nanometer scale under high-vacuum and low-vacuum environment. Equipped with EDS, EBSD and CL.
- NanoIndenter/Atomic Force Microscope (NIAFM) – Nanomechanical test instrument for measuring the hardness and elastic modulus of materials, and imaging surface morphology down to atomic scale.
- X-Ray Diffractometer – Includes standard and parallel beam for use with thin films, powders, nanomaterials.
- NanoMill – Low-energy, low-angle argon ion milling instrument used for preparing ultra-thin, high-quality transmission electron microscopy (TEM) specimens.
- Microhardness Tester –Measures and evaluates microhardness of materials.
If you are interested in working with INL and the CAES MaCS, email Javier Martinez (javier.martinez@inl.gov) for more information.
INL is looking for partners who meet the following criteria:
- Seeking a longer-term strategic relationship to achieve mutual objectives and collaborate on funding opportunities.
- Capable of fully funding the work or meeting cost-share commitments to seek DOE or other funding at a minimum level of $200,000.
- Willing to collaborate under a DOE-approved mechanism, such as a User Facility Agreement, Cooperative Research and Development Agreement, or Strategic Partnership Project.
Please note that INL is not a source of funding for this opportunity. All work performed at INL must be funded by your company or through funds received from government sources.
We look forward to exploring the possibilities of working together to advance your research, development, and demonstration goals.
- 1955 N Fremont Avenue
- Idaho Falls , ID 83415
- USA
- Javier Martinez
- javier.martinez@inl.gov
- Phone Number 2082429595
- Nov 16, 2023 12:51 pm MSTSpecial Notice (Updated)
- Nov 09, 2023 09:55 pm MST Special Notice (Updated)
- May 03, 2023 10:03 pm MDT Special Notice (Original)
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